Digital Twins for Process Manufacturing: Open Architecture

Manufacturers need to vet commercially available sensors, data aggregation solutions (enterprise and open architecture), artificial intelligence-based data analytics packages, and cybersecurity solutions. Yet, they are often unable to experiment with the full array of sensor technologies, commercial offerings, and architectures without affecting day-to-day factory function.

An open architecture digital twin testbed that allows for experimentation without modification of the various tools solves that problem.

The team from ADI, Dow, and the University of Michigan developed and implemented a framework for gathering and analyzing process manufacturing line data needed to improve visibility and control. This leveraged an open architecture for "plug-and-play" interoperability across several standard protocol and vendor options. Also, an integration test environment (ITE) was built to host a simulated process manufacturing system that took real inputs from a physical testbed and emulated new devices with the aid of small, inexpensive computers.

Specifically, the ITE combined off-the-shelf industrial computing components with ADI’s ADEPT framework to provide connectivity across legacy and future interfaces. By working within this framework, applications such as the developed digital twins for pump condition monitoring, control loop performance, and process health had access to real-time data and compute. This was enhanced by single-board computers that mimicked new devices and/or technology.

Creation of an ITE to allow manufacturers to test devices, protocols, and commercial offerings from multiple vendors lowers the risk of new technology adoption. Coupled with a digital twin, manufacturers can iterate through designs virtually and receive feedback on any impact to their process. This empowers companies to change more quickly, whether fueling ongoing digital transformation or in response to a crisis. By leveraging ADI’s ADEPT framework or other open automation architectures, manufacturers can benefit from low-cost, low-disruption experimentation. Changes to the process and production equipment can be modeled and evaluated before making physical changes, enabling manufacturers to develop, test, and evaluate new technologies without interrupting production and or requiring costly R&D investments.

The developed Integration Test Environment (ITE) combines off-the-shelf industrial computing components with ADI’s ADEPT framework to provide connectivity across legacy and future interfaces. By centralizing within this framework, various applications such as the developed Digital Twins for pump condition monitoring, control loop performance, and process health have access to real-time data and compute. This capability is enhanced by single-board computers that can emulate new devices or technology in the system.